TEST_NAME : Wafer
TEST_DATE : 24_10_07-21_08_52
OPERATOR  : Carmen S.; Oleksandr S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-039-011-021-12 | FUSED_ID : 6359364768413823324
  IC_TEMP :  -68.61 | VDDM : 1123.90 | AUX_INT :  -76.45 | CsaBias :    9.48
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.81638e-03 / 2
  ADC_P0  : -7.64545e-02 ± 3.30457e-02
  ADC_P1  : 9.63547e-03 ± 8.14752e-04
  ADC_P2  : -9.68385e-06 ± 3.94988e-06
  CSA_Chi2/NDF : 1.87589e-04 / 2
  CSA_P0  : 5.93877e-02 ± 9.13536e-03
  CSA_P1  : 1.05715e-02 ± 6.88284e-04
  CSA_P2  : -5.91822e-05 ± 1.04817e-05
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  1
 | N_BROKEN_FAST :  [75]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  0
 | P_BROKEN_FAST :  []
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.202', '0.3764', '1.800', '0.1571', '1.800', '0.0996', '7.000', '0.7079', 1, 1, 1, 1, 1728328132.7521465]
VI_after__Init : ['1.202', '0.3770', '1.800', '0.1573', '1.800', '0.0942', '7.000', '0.7080', 1, 1, 1, 1, 1728328140.8075824]
VI_at__the_End : ['1.202', '0.4857', '1.800', '0.1403', '1.801', '0.1211', '7.000', '0.7087', 1, 1, 1, 1, 1728328208.3145072]