TEST_NAME : Wafer
TEST_DATE : 24_10_07-21_05_35
OPERATOR  : Carmen S.; Oleksandr S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-039-011-023-12 | FUSED_ID : 6359364768413823356
  IC_TEMP :  -66.56 | VDDM : 1121.03 | AUX_INT :   -7.80 | CsaBias :   78.52
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.14688e-03 / 2
  ADC_P0  : -7.80242e-03 ± 2.29202e-02
  ADC_P1  : 8.69797e-03 ± 5.80754e-04
  ADC_P2  : -6.61802e-06 ± 2.90618e-06
  CSA_Chi2/NDF : 1.72097e-04 / 2
  CSA_P0  : 5.96061e-02 ± 8.75002e-03
  CSA_P1  : 1.00919e-02 ± 6.59251e-04
  CSA_P2  : -5.22767e-05 ± 1.00396e-05
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  0
 | N_BROKEN_FAST :  []
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  0
 | P_BROKEN_FAST :  []
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.202', '0.3391', '1.800', '0.1632', '1.800', '0.0990', '7.000', '0.7079', 1, 1, 1, 1, 1728327935.3021545]
VI_after__Init : ['1.202', '0.3372', '1.800', '0.1629', '1.800', '0.0937', '7.000', '0.7079', 1, 1, 1, 1, 1728327943.9774818]
VI_at__the_End : ['1.201', '0.4850', '1.800', '0.1425', '1.799', '0.1160', '7.000', '0.7086', 1, 1, 1, 1, 1728328005.7917402]