TEST_NAME : Wafer
TEST_DATE : 24_10_07-21_03_57
OPERATOR  : Carmen S.; Oleksandr S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-039-011-024-12 | FUSED_ID : 6359364768413823372
  IC_TEMP :  -63.64 | VDDM : 1112.16 | AUX_INT :  -10.83 | CsaBias :   73.13
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.94126e-03 / 2
  ADC_P0  : -1.08251e-02 ± 2.98659e-02
  ADC_P1  : 8.46095e-03 ± 7.20869e-04
  ADC_P2  : -6.49610e-06 ± 3.46119e-06
  CSA_Chi2/NDF : 1.04609e-04 / 2
  CSA_P0  : 5.95777e-02 ± 6.82194e-03
  CSA_P1  : 9.45245e-03 ± 5.13984e-04
  CSA_P2  : -4.30065e-05 ± 7.82736e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  1
 | N_BROKEN_FAST :  [71]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  0
 | P_BROKEN_FAST :  []
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.201', '0.2652', '1.800', '0.1328', '1.800', '0.0891', '7.000', '0.7081', 1, 1, 1, 1, 1728327837.052587]
VI_after__Init : ['1.202', '0.2653', '1.800', '0.1329', '1.799', '0.0835', '7.000', '0.7079', 1, 1, 1, 1, 1728327845.2080011]
VI_at__the_End : ['1.202', '0.4796', '1.800', '0.1366', '1.802', '0.1189', '7.000', '0.7086', 1, 1, 1, 1, 1728327913.9067745]