TEST_NAME : Wafer
TEST_DATE : 24_10_07-21_02_18
OPERATOR  : Carmen S.; Oleksandr S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-039-011-025-12 | FUSED_ID : 6359364768413823388
  IC_TEMP :  -63.87 | VDDM : 1112.22 | AUX_INT :  -10.41 | CsaBias :   86.22
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.74333e-03 / 2
  ADC_P0  : -1.04053e-02 ± 2.83118e-02
  ADC_P1  : 8.12027e-03 ± 6.62073e-04
  ADC_P2  : -5.66133e-06 ± 3.08724e-06
  CSA_Chi2/NDF : 1.36485e-04 / 2
  CSA_P0  : 5.92874e-02 ± 7.79229e-03
  CSA_P1  : 9.78195e-03 ± 5.87093e-04
  CSA_P2  : -4.68247e-05 ± 8.94073e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  0
 | N_BROKEN_FAST :  []
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  1
 | P_BROKEN_FAST :  [94]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.202', '0.3601', '1.800', '0.1568', '1.799', '0.0971', '7.000', '0.7087', 1, 1, 1, 1, 1728327737.5300047]
VI_after__Init : ['1.202', '0.3606', '1.800', '0.1571', '1.800', '0.0896', '7.000', '0.7078', 1, 1, 1, 1, 1728327746.2824075]
VI_at__the_End : ['1.202', '0.4857', '1.800', '0.1353', '1.803', '0.1177', '7.000', '0.7086', 1, 1, 1, 1, 1728327807.2537854]