TEST_NAME : Wafer
TEST_DATE : 24_10_07-21_00_39
OPERATOR  : Carmen S.; Oleksandr S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-039-011-026-12 | FUSED_ID : 6359364768413823404
  IC_TEMP :  -62.16 | VDDM : 1118.93 | AUX_INT :   -9.66 | CsaBias :   87.99
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.38595e-03 / 2
  ADC_P0  : -9.66214e-03 ± 2.51713e-02
  ADC_P1  : 8.21289e-03 ± 5.88429e-04
  ADC_P2  : -6.27142e-06 ± 2.73312e-06
  CSA_Chi2/NDF : 1.13910e-04 / 2
  CSA_P0  : 5.68974e-02 ± 7.11875e-03
  CSA_P1  : 9.27635e-03 ± 5.36346e-04
  CSA_P2  : -3.98289e-05 ± 8.16792e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  1
 | N_BROKEN_FAST :  [40]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  1
 | P_BROKEN_FAST :  [108]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.202', '0.1718', '1.800', '0.1658', '1.800', '0.0904', '7.000', '0.7090', 1, 1, 1, 1, 1728327638.6974504]
VI_after__Init : ['1.202', '0.1717', '1.800', '0.1658', '1.801', '0.0832', '7.000', '0.7079', 1, 1, 1, 1, 1728327646.8168578]
VI_at__the_End : ['1.202', '0.4796', '1.800', '0.1377', '1.803', '0.1171', '7.000', '0.7088', 1, 1, 1, 1, 1728327707.1323059]