TEST_NAME : Wafer
TEST_DATE : 24_10_07-20_59_01
OPERATOR  : Carmen S.; Oleksandr S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-039-011-027-12 | FUSED_ID : 6359364768413823420
  IC_TEMP :  -62.65 | VDDM : 1121.60 | AUX_INT :   -7.94 | CsaBias :   76.82
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.13228e-03 / 2
  ADC_P0  : -7.94320e-03 ± 2.27661e-02
  ADC_P1  : 8.54050e-03 ± 5.64838e-04
  ADC_P2  : -6.44079e-06 ± 2.76912e-06
  CSA_Chi2/NDF : 1.14113e-04 / 2
  CSA_P0  : 5.71234e-02 ± 7.12509e-03
  CSA_P1  : 9.70914e-03 ± 5.36824e-04
  CSA_P2  : -4.35019e-05 ± 8.17519e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  3
 | N_BROKEN_FAST :  [56, 101, 104]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  2
 | P_BROKEN_FAST :  [22, 69]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.202', '0.1445', '1.800', '0.1320', '1.799', '0.0873', '7.000', '0.7090', 1, 1, 1, 1, 1728327541.0726416]
VI_after__Init : ['1.202', '0.1444', '1.800', '0.1319', '1.800', '0.0796', '7.000', '0.7078', 1, 1, 1, 1, 1728327549.1230462]
VI_at__the_End : ['1.202', '0.4924', '1.800', '0.1348', '1.806', '0.1147', '7.000', '0.7088', 1, 1, 1, 1, 1728327617.822988]