TEST_NAME : Wafer
TEST_DATE : 24_10_07-21_43_19
OPERATOR  : Carmen S.; Oleksandr S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-039-012-003-03 | FUSED_ID : 6359364768413827123
  IC_TEMP :  -69.21 | VDDM : 1105.04 | AUX_INT :   -7.58 | CsaBias :   60.46
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.11737e-03 / 2
  ADC_P0  : -7.58282e-03 ± 2.26086e-02
  ADC_P1  : 8.55942e-03 ± 5.59138e-04
  ADC_P2  : -6.73848e-06 ± 2.72586e-06
  CSA_Chi2/NDF : 1.50160e-04 / 2
  CSA_P0  : 5.79956e-02 ± 8.17335e-03
  CSA_P1  : 9.82992e-03 ± 6.15803e-04
  CSA_P2  : -4.78930e-05 ± 9.37795e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  4
 | N_BROKEN_FAST :  [16, 77, 94, 120]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  0
 | P_BROKEN_FAST :  []
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.202', '0.2858', '1.800', '0.1462', '1.800', '0.0915', '7.000', '0.7079', 1, 1, 1, 1, 1728330199.2115777]
VI_after__Init : ['1.202', '0.2859', '1.800', '0.1460', '1.800', '0.0844', '6.999', '0.7072', 1, 1, 1, 1, 1728330207.3189733]
VI_at__the_End : ['1.202', '0.4811', '1.800', '0.1385', '1.800', '0.1160', '7.000', '0.7077', 1, 1, 1, 1, 1728330267.3454616]