TEST_NAME : Wafer
TEST_DATE : 24_10_07-21_48_16
OPERATOR  : Carmen S.; Oleksandr S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-039-012-006-03 | FUSED_ID : 6359364768413827171
  IC_TEMP :  -68.50 | VDDM : 1114.88 | AUX_INT :   -6.65 | CsaBias :   63.33
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 7.70781e-04 / 2
  ADC_P0  : -6.64519e-03 ± 1.87297e-02
  ADC_P1  : 8.80546e-03 ± 4.74473e-04
  ADC_P2  : -7.38483e-06 ± 2.36471e-06
  CSA_Chi2/NDF : 1.86979e-04 / 2
  CSA_P0  : 6.04851e-02 ± 9.12050e-03
  CSA_P1  : 1.01095e-02 ± 6.87164e-04
  CSA_P2  : -5.36647e-05 ± 1.04647e-05
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  3
 | N_BROKEN_FAST :  [69, 78, 120]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  2
 | P_BROKEN_FAST :  [3, 121]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.202', '0.3011', '1.800', '0.1544', '1.799', '0.0937', '7.000', '0.7080', 1, 1, 1, 1, 1728330496.196108]
VI_after__Init : ['1.202', '0.3012', '1.800', '0.1544', '1.800', '0.0859', '7.000', '0.7074', 1, 1, 1, 1, 1728330504.3175483]
VI_at__the_End : ['1.202', '0.4824', '1.800', '0.1412', '1.802', '0.1161', '7.000', '0.7080', 1, 1, 1, 1, 1728330564.5269907]