TEST_NAME : Wafer
TEST_DATE : 24_10_07-21_51_33
OPERATOR  : Carmen S.; Oleksandr S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-039-012-008-03 | FUSED_ID : 6359364768413827203
  IC_TEMP :  -60.08 | VDDM : 1123.18 | AUX_INT :   -8.38 | CsaBias :   82.55
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.60091e-03 / 2
  ADC_P0  : -8.38153e-03 ± 2.71137e-02
  ADC_P1  : 8.33391e-03 ± 6.53612e-04
  ADC_P2  : -6.13117e-06 ± 3.12128e-06
  CSA_Chi2/NDF : 1.38432e-04 / 2
  CSA_P0  : 6.04584e-02 ± 7.84767e-03
  CSA_P1  : 9.89278e-03 ± 5.91265e-04
  CSA_P2  : -4.83177e-05 ± 9.00427e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  3
 | N_BROKEN_FAST :  [75, 83, 122]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  2
 | P_BROKEN_FAST :  [64, 105]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.202', '0.3407', '1.800', '0.1532', '1.800', '0.0960', '7.000', '0.7076', 1, 1, 1, 1, 1728330693.4891617]
VI_after__Init : ['1.202', '0.3407', '1.800', '0.1532', '1.801', '0.0904', '6.999', '0.7076', 1, 1, 1, 1, 1728330701.7374392]
VI_at__the_End : ['1.202', '0.4879', '1.800', '0.1410', '1.803', '0.1144', '7.000', '0.7082', 1, 1, 1, 1, 1728330764.2584848]