TEST_NAME : Wafer
TEST_DATE : 24_10_07-21_54_51
OPERATOR  : Carmen S.; Oleksandr S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-039-012-010-03 | FUSED_ID : 6359364768413827235
  IC_TEMP :  -65.23 | VDDM : 1121.29 | AUX_INT :  -88.03 | CsaBias :   -1.01
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.90635e-03 / 2
  ADC_P0  : -8.80274e-02 ± 3.44152e-02
  ADC_P1  : 9.76252e-03 ± 8.31009e-04
  ADC_P2  : -1.04479e-05 ± 3.95456e-06
  CSA_Chi2/NDF : 1.62827e-04 / 2
  CSA_P0  : 5.90332e-02 ± 8.51109e-03
  CSA_P1  : 1.01472e-02 ± 6.41249e-04
  CSA_P2  : -5.41742e-05 ± 9.76546e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  0
 | N_BROKEN_FAST :  []
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  3
 | P_BROKEN_FAST :  [15, 51, 65]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.202', '0.1654', '1.800', '0.1418', '1.800', '0.0849', '7.000', '0.7073', 1, 1, 1, 1, 1728330890.9816124]
VI_after__Init : ['1.200', '0.1654', '1.800', '0.1417', '1.802', '0.0794', '7.000', '0.7072', 1, 1, 1, 1, 1728330899.0858505]
VI_at__the_End : ['1.202', '0.4788', '1.800', '0.1382', '1.801', '0.1176', '7.000', '0.7082', 1, 1, 1, 1, 1728330963.050945]