TEST_NAME : Wafer
TEST_DATE : 24_10_07-21_56_29
OPERATOR  : Carmen S.; Oleksandr S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-039-012-011-03 | FUSED_ID : 6359364768413827251
  IC_TEMP :  -62.17 | VDDM : 1105.02 | AUX_INT :   -7.45 | CsaBias :   82.09
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.00834e-03 / 2
  ADC_P0  : -7.44801e-03 ± 2.14863e-02
  ADC_P1  : 8.20385e-03 ± 5.14455e-04
  ADC_P2  : -5.82228e-06 ± 2.43461e-06
  CSA_Chi2/NDF : 9.81438e-05 / 2
  CSA_P0  : 6.01615e-02 ± 6.60775e-03
  CSA_P1  : 9.54678e-03 ± 4.97846e-04
  CSA_P2  : -4.47301e-05 ± 7.58161e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  2
 | N_BROKEN_FAST :  [1, 103]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  1
 | P_BROKEN_FAST :  [95]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.201', '0.3766', '1.800', '0.1370', '1.800', '0.0992', '7.000', '0.7082', 1, 1, 1, 1, 1728330989.5698287]
VI_after__Init : ['1.202', '0.3768', '1.800', '0.1371', '1.799', '0.0920', '7.000', '0.7075', 1, 1, 1, 1, 1728330997.659147]
VI_at__the_End : ['1.202', '0.4788', '1.800', '0.1398', '1.800', '0.1155', '7.000', '0.7083', 1, 1, 1, 1, 1728331061.8081017]