TEST_NAME : Wafer
TEST_DATE : 24_10_07-21_59_46
OPERATOR  : Carmen S.; Oleksandr S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-039-012-013-03 | FUSED_ID : 6359364768413827283
  IC_TEMP :  -60.45 | VDDM : 1118.58 | AUX_INT :   -9.82 | CsaBias :   73.16
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.74798e-03 / 2
  ADC_P0  : -9.81691e-03 ± 2.83907e-02
  ADC_P1  : 8.35313e-03 ± 6.94790e-04
  ADC_P2  : -5.53673e-06 ± 3.38603e-06
  CSA_Chi2/NDF : 1.08002e-04 / 2
  CSA_P0  : 6.04160e-02 ± 6.93168e-03
  CSA_P1  : 9.50467e-03 ± 5.22252e-04
  CSA_P2  : -4.31515e-05 ± 7.95328e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  1
 | N_BROKEN_FAST :  [57]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  3
 | P_BROKEN_FAST :  [92, 103, 114]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.202', '0.2967', '1.800', '0.1822', '1.799', '0.0880', '7.000', '0.7077', 1, 1, 1, 1, 1728331186.74143]
VI_after__Init : ['1.202', '0.2972', '1.800', '0.1822', '1.800', '0.0826', '7.000', '0.7075', 1, 1, 1, 1, 1728331194.7928927]
VI_at__the_End : ['1.202', '0.4843', '1.800', '0.1381', '1.806', '0.1142', '7.000', '0.7082', 1, 1, 1, 1, 1728331259.5008755]