TEST_NAME : Wafer
TEST_DATE : 24_10_07-22_01_24
OPERATOR  : Carmen S.; Oleksandr S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-039-012-014-03 | FUSED_ID : 6359364768413827299
  IC_TEMP :  -63.22 | VDDM : 1119.65 | AUX_INT :   -7.25 | CsaBias :   79.41
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.16836e-03 / 2
  ADC_P0  : -7.24931e-03 ± 2.31155e-02
  ADC_P1  : 8.73565e-03 ± 5.82474e-04
  ADC_P2  : -6.96707e-06 ± 2.90089e-06
  CSA_Chi2/NDF : 1.42391e-04 / 2
  CSA_P0  : 5.86254e-02 ± 7.95909e-03
  CSA_P1  : 1.00583e-02 ± 5.99660e-04
  CSA_P2  : -5.09464e-05 ± 9.13211e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  2
 | N_BROKEN_FAST :  [69, 111]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  0
 | P_BROKEN_FAST :  []
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.202', '0.2441', '1.800', '0.2181', '1.800', '0.0977', '7.000', '0.7076', 1, 1, 1, 1, 1728331284.7328217]
VI_after__Init : ['1.202', '0.2442', '1.800', '0.2175', '1.799', '0.0922', '7.000', '0.7077', 1, 1, 1, 1, 1728331293.0683184]
VI_at__the_End : ['1.202', '0.4829', '1.800', '0.1403', '1.805', '0.1165', '7.000', '0.7081', 1, 1, 1, 1, 1728331355.5983973]