TEST_NAME : Wafer
TEST_DATE : 24_10_07-22_04_41
OPERATOR  : Carmen S.; Oleksandr S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-039-012-016-04 | FUSED_ID : 6359364768413827332
  IC_TEMP :  -70.17 | VDDM : 1120.28 | AUX_INT :  -10.09 | CsaBias :   74.27
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.99695e-03 / 2
  ADC_P0  : -1.00884e-02 ± 3.02595e-02
  ADC_P1  : 8.50598e-03 ± 7.24336e-04
  ADC_P2  : -7.03509e-06 ± 3.44286e-06
  CSA_Chi2/NDF : 9.66556e-05 / 2
  CSA_P0  : 5.91354e-02 ± 6.55746e-03
  CSA_P1  : 9.77608e-03 ± 4.94057e-04
  CSA_P2  : -5.06916e-05 ± 7.52391e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  2
 | N_BROKEN_FAST :  [99, 122]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  1
 | P_BROKEN_FAST :  [70]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  A ASIC READY for MODULE ASSEMBLY
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VI_before_Init : ['1.202', '0.3914', '1.800', '0.1914', '1.800', '0.0999', '7.000', '0.7076', 1, 1, 1, 1, 1728331480.6978197]
VI_after__Init : ['1.202', '0.3919', '1.800', '0.1916', '1.802', '0.0940', '7.000', '0.7076', 1, 1, 1, 1, 1728331489.4941535]
VI_at__the_End : ['1.202', '0.4704', '1.800', '0.1388', '1.807', '0.1171', '7.000', '0.7083', 1, 1, 1, 1, 1728331553.023261]