TEST_NAME : Wafer
TEST_DATE : 24_10_07-22_06_19
OPERATOR  : Carmen S.; Oleksandr S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-039-012-017-04 | FUSED_ID : 6359364768413827348
  IC_TEMP :  -65.51 | VDDM : 1114.81 | AUX_INT :  -10.76 | CsaBias :   72.79
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.73626e-03 / 2
  ADC_P0  : -1.07635e-02 ± 2.82117e-02
  ADC_P1  : 8.41912e-03 ± 6.77087e-04
  ADC_P2  : -6.39087e-06 ± 3.23883e-06
  CSA_Chi2/NDF : 1.26304e-04 / 2
  CSA_P0  : 5.89728e-02 ± 7.49602e-03
  CSA_P1  : 9.92035e-03 ± 5.64771e-04
  CSA_P2  : -5.07479e-05 ± 8.60080e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  2
 | N_BROKEN_FAST :  [20, 56]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  2
 | P_BROKEN_FAST :  [4, 110]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.202', '0.1964', '1.800', '0.1579', '1.799', '0.0908', '7.000', '0.7084', 1, 1, 1, 1, 1728331578.6622581]
VI_after__Init : ['1.202', '0.1964', '1.800', '0.1580', '1.800', '0.0835', '7.000', '0.7076', 1, 1, 1, 1, 1728331587.3825512]
VI_at__the_End : ['1.196', '0.4758', '1.800', '0.1369', '1.810', '0.1191', '7.000', '0.7084', 1, 1, 1, 1, 1728331651.0736628]