TEST_NAME : Wafer
TEST_DATE : 24_10_07-22_09_36
OPERATOR  : Carmen S.; Oleksandr S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-039-012-019-04 | FUSED_ID : 6359364768413827380
  IC_TEMP :  -72.15 | VDDM : 1115.32 | AUX_INT :   -7.79 | CsaBias :   59.45
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.34341e-03 / 2
  ADC_P0  : -7.79013e-03 ± 2.48087e-02
  ADC_P1  : 8.45672e-03 ± 6.05034e-04
  ADC_P2  : -6.46235e-06 ± 2.92044e-06
  CSA_Chi2/NDF : 1.52321e-04 / 2
  CSA_P0  : 5.92881e-02 ± 8.23195e-03
  CSA_P1  : 1.01221e-02 ± 6.20218e-04
  CSA_P2  : -5.49791e-05 ± 9.44518e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  0
 | N_BROKEN_FAST :  []
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  3
 | P_BROKEN_FAST :  [22, 78, 105]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.202', '0.2906', '1.800', '0.1527', '1.800', '0.0989', '7.000', '0.7076', 1, 1, 1, 1, 1728331775.910212]
VI_after__Init : ['1.202', '0.2910', '1.800', '0.1529', '1.799', '0.0932', '7.000', '0.7077', 1, 1, 1, 1, 1728331783.9255931]
VI_at__the_End : ['1.202', '0.4752', '1.800', '0.1399', '1.803', '0.1211', '7.000', '0.7085', 1, 1, 1, 1, 1728331845.5438344]