TEST_NAME : Wafer
TEST_DATE : 24_10_07-22_11_14
OPERATOR  : Carmen S.; Oleksandr S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-039-012-020-04 | FUSED_ID : 6359364768413827396
  IC_TEMP :  -63.55 | VDDM : 1124.48 | AUX_INT :   -9.37 | CsaBias :   67.14
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.64123e-03 / 2
  ADC_P0  : -9.37313e-03 ± 2.74336e-02
  ADC_P1  : 8.56417e-03 ± 6.69309e-04
  ADC_P2  : -6.98797e-06 ± 3.22768e-06
  CSA_Chi2/NDF : 9.76553e-05 / 2
  CSA_P0  : 5.86267e-02 ± 6.59129e-03
  CSA_P1  : 9.29575e-03 ± 4.96606e-04
  CSA_P2  : -4.09185e-05 ± 7.56272e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  3
 | N_BROKEN_FAST :  [33, 59, 111]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  1
 | P_BROKEN_FAST :  [111]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.202', '0.3009', '1.800', '0.1693', '1.800', '0.0968', '7.000', '0.7076', 1, 1, 1, 1, 1728331874.4027216]
VI_after__Init : ['1.202', '0.3009', '1.800', '0.1695', '1.801', '0.0915', '7.000', '0.7078', 1, 1, 1, 1, 1728331882.5479374]
VI_at__the_End : ['1.201', '0.4787', '1.800', '0.1381', '1.807', '0.1154', '7.000', '0.7084', 1, 1, 1, 1, 1728331942.5374653]