TEST_NAME : Wafer
TEST_DATE : 24_10_07-22_12_53
OPERATOR  : Carmen S.; Oleksandr S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-039-012-021-04 | FUSED_ID : 6359364768413827412
  IC_TEMP :  -65.35 | VDDM : 1123.50 | AUX_INT :   -8.55 | CsaBias :   67.09
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.56558e-03 / 2
  ADC_P0  : -8.54760e-03 ± 2.68387e-02
  ADC_P1  : 8.45580e-03 ± 6.64601e-04
  ADC_P2  : -5.75926e-06 ± 3.27450e-06
  CSA_Chi2/NDF : 1.50889e-04 / 2
  CSA_P0  : 6.14857e-02 ± 8.19315e-03
  CSA_P1  : 1.02064e-02 ± 6.17295e-04
  CSA_P2  : -5.49915e-05 ± 9.40067e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  1
 | N_BROKEN_FAST :  [31]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  0
 | P_BROKEN_FAST :  []
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.202', '0.2205', '1.800', '0.1804', '1.799', '0.0884', '7.000', '0.7079', 1, 1, 1, 1, 1728331973.0850825]
VI_after__Init : ['1.202', '0.2205', '1.800', '0.1805', '1.799', '0.0828', '7.000', '0.7077', 1, 1, 1, 1, 1728331981.842413]
VI_at__the_End : ['1.197', '0.4838', '1.800', '0.1392', '1.799', '0.1185', '7.000', '0.7085', 1, 1, 1, 1, 1728332041.563782]