TEST_NAME : Wafer
TEST_DATE : 24_10_07-22_17_48
OPERATOR  : Carmen S.; Oleksandr S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-039-012-024-04 | FUSED_ID : 6359364768413827460
  IC_TEMP :  -62.66 | VDDM : 1129.93 | AUX_INT :   -7.16 | CsaBias :   68.83
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.03630e-03 / 2
  ADC_P0  : -7.16486e-03 ± 2.17967e-02
  ADC_P1  : 8.49915e-03 ± 5.43734e-04
  ADC_P2  : -6.12333e-06 ± 2.67817e-06
  CSA_Chi2/NDF : 1.26085e-04 / 2
  CSA_P0  : 5.97989e-02 ± 7.48953e-03
  CSA_P1  : 9.97520e-03 ± 5.64282e-04
  CSA_P2  : -4.72595e-05 ± 8.59334e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  0
 | N_BROKEN_FAST :  []
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  0
 | P_BROKEN_FAST :  []
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.202', '0.2707', '1.800', '0.1643', '1.799', '0.0879', '7.000', '0.7080', 1, 1, 1, 1, 1728332268.2194254]
VI_after__Init : ['1.202', '0.2706', '1.800', '0.1634', '1.800', '0.0831', '7.000', '0.7079', 1, 1, 1, 1, 1728332276.2008963]
VI_at__the_End : ['1.202', '0.4986', '1.800', '0.1408', '1.799', '0.1156', '7.000', '0.7085', 1, 1, 1, 1, 1728332341.3949075]