TEST_NAME : Wafer
TEST_DATE : 24_10_07-22_22_44
OPERATOR  : Carmen S.; Oleksandr S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-039-012-027-04 | FUSED_ID : 6359364768413827508
  IC_TEMP :  -68.87 | VDDM : 1119.36 | AUX_INT :   -7.25 | CsaBias :   68.81
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.13488e-03 / 2
  ADC_P0  : -7.24820e-03 ± 2.28028e-02
  ADC_P1  : 8.50805e-03 ± 5.66984e-04
  ADC_P2  : -6.35497e-06 ± 2.77697e-06
  CSA_Chi2/NDF : 1.06177e-04 / 2
  CSA_P0  : 5.83135e-02 ± 6.87285e-03
  CSA_P1  : 9.61091e-03 ± 5.17819e-04
  CSA_P2  : -4.41416e-05 ± 7.88578e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  1
 | N_BROKEN_FAST :  [31]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  2
 | P_BROKEN_FAST :  [1, 8]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.202', '0.1541', '1.800', '0.1554', '1.800', '0.0887', '7.000', '0.7079', 1, 1, 1, 1, 1728332564.337851]
VI_after__Init : ['1.202', '0.1541', '1.800', '0.1554', '1.800', '0.0834', '7.000', '0.7078', 1, 1, 1, 1, 1728332572.3442855]
VI_at__the_End : ['1.201', '0.4850', '1.800', '0.1371', '1.803', '0.1188', '7.000', '0.7086', 1, 1, 1, 1, 1728332635.875457]