TEST_NAME : Wafer
TEST_DATE : 24_10_07-22_55_36
OPERATOR  : Carmen S.; Oleksandr S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-039-013-007-14 | FUSED_ID : 6359364768413831294
  IC_TEMP :  -65.88 | VDDM : 1112.33 | AUX_INT :   -7.94 | CsaBias :   84.19
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.32422e-03 / 2
  ADC_P0  : -7.94280e-03 ± 2.46385e-02
  ADC_P1  : 8.44431e-03 ± 6.02781e-04
  ADC_P2  : -6.21287e-06 ± 2.92575e-06
  CSA_Chi2/NDF : 1.54802e-04 / 2
  CSA_P0  : 5.95961e-02 ± 8.29872e-03
  CSA_P1  : 9.85407e-03 ± 6.25249e-04
  CSA_P2  : -4.91961e-05 ± 9.52180e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  3
 | N_BROKEN_FAST :  [30, 90, 121]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  2
 | P_BROKEN_FAST :  [24, 109]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.202', '0.3833', '1.800', '0.1279', '1.799', '0.1006', '7.000', '0.7085', 1, 1, 1, 1, 1728334535.9497113]
VI_after__Init : ['1.202', '0.3837', '1.800', '0.1280', '1.800', '0.0933', '7.000', '0.7079', 1, 1, 1, 1, 1728334544.0361252]
VI_at__the_End : ['1.202', '0.4826', '1.800', '0.1375', '1.800', '0.1151', '7.000', '0.7084', 1, 1, 1, 1, 1728334601.160611]