TEST_NAME : Wafer
TEST_DATE : 24_10_07-22_53_57
OPERATOR  : Carmen S.; Oleksandr S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-039-013-008-14 | FUSED_ID : 6359364768413831310
  IC_TEMP :  -65.13 | VDDM : 1121.83 | AUX_INT :   -7.79 | CsaBias :   67.80
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.34341e-03 / 2
  ADC_P0  : -7.79013e-03 ± 2.48087e-02
  ADC_P1  : 8.45672e-03 ± 6.05034e-04
  ADC_P2  : -6.46235e-06 ± 2.92044e-06
  CSA_Chi2/NDF : 1.36826e-04 / 2
  CSA_P0  : 5.82880e-02 ± 7.80201e-03
  CSA_P1  : 9.84285e-03 ± 5.87825e-04
  CSA_P2  : -4.91000e-05 ± 8.95188e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  2
 | N_BROKEN_FAST :  [43, 78]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  1
 | P_BROKEN_FAST :  [56]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.202', '0.3036', '1.800', '0.1735', '1.799', '0.0985', '7.000', '0.7086', 1, 1, 1, 1, 1728334437.7402918]
VI_after__Init : ['1.202', '0.3039', '1.800', '0.1736', '1.800', '0.0912', '7.000', '0.7079', 1, 1, 1, 1, 1728334445.7697735]
VI_at__the_End : ['1.202', '0.4794', '1.800', '0.1378', '1.804', '0.1187', '7.000', '0.7085', 1, 1, 1, 1, 1728334501.3584566]