TEST_NAME : Wafer
TEST_DATE : 24_10_07-22_52_18
OPERATOR  : Carmen S.; Oleksandr S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-039-013-009-14 | FUSED_ID : 6359364768413831326
  IC_TEMP :  -65.43 | VDDM : 1116.21 | AUX_INT :   -9.05 | CsaBias :   82.20
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.58990e-03 / 2
  ADC_P0  : -9.04716e-03 ± 2.70166e-02
  ADC_P1  : 8.36131e-03 ± 6.51877e-04
  ADC_P2  : -6.02159e-06 ± 3.13285e-06
  CSA_Chi2/NDF : 1.48232e-04 / 2
  CSA_P0  : 5.82485e-02 ± 8.12069e-03
  CSA_P1  : 9.94452e-03 ± 6.11835e-04
  CSA_P2  : -5.23000e-05 ± 9.31752e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  2
 | N_BROKEN_FAST :  [67, 83]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  2
 | P_BROKEN_FAST :  [25, 44]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.202', '0.4587', '1.800', '0.1647', '1.800', '0.0997', '7.000', '0.7080', 1, 1, 1, 1, 1728334338.3942516]
VI_after__Init : ['1.202', '0.4587', '1.800', '0.1650', '1.800', '0.0940', '7.000', '0.7081', 1, 1, 1, 1, 1728334346.5455613]
VI_at__the_End : ['1.202', '0.4735', '1.800', '0.1384', '1.803', '0.1165', '7.000', '0.7086', 1, 1, 1, 1, 1728334416.0771806]