TEST_NAME : Wafer
TEST_DATE : 24_10_07-22_50_40
OPERATOR  : Carmen S.; Oleksandr S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-039-013-010-14 | FUSED_ID : 6359364768413831342
  IC_TEMP :  -63.89 | VDDM : 1127.14 | AUX_INT :   -6.52 | CsaBias :   86.14
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 9.24646e-04 / 2
  ADC_P0  : -6.51592e-03 ± 2.05412e-02
  ADC_P1  : 8.49557e-03 ± 5.05124e-04
  ADC_P2  : -6.54246e-06 ± 2.45340e-06
  CSA_Chi2/NDF : 1.15235e-04 / 2
  CSA_P0  : 5.88700e-02 ± 7.16004e-03
  CSA_P1  : 9.91632e-03 ± 5.39457e-04
  CSA_P2  : -4.82119e-05 ± 8.21530e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  1
 | N_BROKEN_FAST :  [75]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  1
 | P_BROKEN_FAST :  [106]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.202', '0.2432', '1.800', '0.1501', '1.800', '0.0926', '7.000', '0.7079', 1, 1, 1, 1, 1728334240.043911]
VI_after__Init : ['1.202', '0.2435', '1.800', '0.1501', '1.800', '0.0869', '7.000', '0.7080', 1, 1, 1, 1, 1728334248.1763184]
VI_at__the_End : ['1.202', '0.4859', '1.800', '0.1397', '1.808', '0.1162', '7.000', '0.7086', 1, 1, 1, 1, 1728334309.0374448]