TEST_NAME : Wafer
TEST_DATE : 24_10_07-22_47_23
OPERATOR  : Carmen S.; Oleksandr S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-039-013-012-14 | FUSED_ID : 6359364768413831374
  IC_TEMP :  -63.98 | VDDM : 1126.02 | AUX_INT :   -6.45 | CsaBias :   75.79
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 8.97344e-04 / 2
  ADC_P0  : -6.45477e-03 ± 2.02514e-02
  ADC_P1  : 8.28167e-03 ± 4.92094e-04
  ADC_P2  : -5.75088e-06 ± 2.36668e-06
  CSA_Chi2/NDF : 1.46669e-04 / 2
  CSA_P0  : 5.91728e-02 ± 8.07778e-03
  CSA_P1  : 9.78497e-03 ± 6.08602e-04
  CSA_P2  : -4.77127e-05 ± 9.26829e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  3
 | N_BROKEN_FAST :  [15, 45, 126]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  1
 | P_BROKEN_FAST :  [97]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.202', '0.2263', '1.800', '0.1318', '1.800', '0.0935', '7.000', '0.7086', 1, 1, 1, 1, 1728334043.1842718]
VI_after__Init : ['1.202', '0.2261', '1.800', '0.1318', '1.799', '0.0862', '7.000', '0.7079', 1, 1, 1, 1, 1728334051.433684]
VI_at__the_End : ['1.202', '0.4837', '1.800', '0.1373', '1.799', '0.1167', '7.000', '0.7087', 1, 1, 1, 1, 1728334119.8423178]