TEST_NAME : Wafer
TEST_DATE : 24_10_07-22_45_45
OPERATOR  : Carmen S.; Oleksandr S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-039-013-013-14 | FUSED_ID : 6359364768413831390
  IC_TEMP :  -63.76 | VDDM : 1118.72 | AUX_INT :   -9.70 | CsaBias :   74.16
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.89741e-03 / 2
  ADC_P0  : -9.69711e-03 ± 2.95267e-02
  ADC_P1  : 8.45040e-03 ± 7.12681e-04
  ADC_P2  : -6.47311e-06 ± 3.42188e-06
  CSA_Chi2/NDF : 1.45984e-04 / 2
  CSA_P0  : 6.01757e-02 ± 8.05887e-03
  CSA_P1  : 9.98251e-03 ± 6.07178e-04
  CSA_P2  : -5.02976e-05 ± 9.24660e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  1
 | N_BROKEN_FAST :  [120]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  1
 | P_BROKEN_FAST :  [27]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.202', '0.2191', '1.800', '0.1405', '1.799', '0.0890', '7.000', '0.7080', 1, 1, 1, 1, 1728333944.8430896]
VI_after__Init : ['1.202', '0.2191', '1.800', '0.1405', '1.801', '0.0839', '7.000', '0.7079', 1, 1, 1, 1, 1728333953.0565064]
VI_at__the_End : ['1.202', '0.4852', '1.800', '0.1368', '1.800', '0.1171', '7.000', '0.7086', 1, 1, 1, 1, 1728334022.3330483]