TEST_NAME : Wafer
TEST_DATE : 24_10_07-22_37_33
OPERATOR  : Carmen S.; Oleksandr S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-039-013-018-09 | FUSED_ID : 6359364768413831465
  IC_TEMP :  -72.97 | VDDM : 1114.19 | AUX_INT :   -7.73 | CsaBias :   75.80
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.20780e-03 / 2
  ADC_P0  : -7.72903e-03 ± 2.34875e-02
  ADC_P1  : 8.41795e-03 ± 5.67808e-04
  ADC_P2  : -6.54338e-06 ± 2.71566e-06
  CSA_Chi2/NDF : 1.61362e-04 / 2
  CSA_P0  : 5.94866e-02 ± 8.47273e-03
  CSA_P1  : 9.92903e-03 ± 6.38359e-04
  CSA_P2  : -5.30449e-05 ± 9.72146e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  1
 | N_BROKEN_FAST :  [88]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  1
 | P_BROKEN_FAST :  [32]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.202', '0.2494', '1.800', '0.1735', '1.800', '0.0919', '7.000', '0.7078', 1, 1, 1, 1, 1728333452.8172934]
VI_after__Init : ['1.202', '0.2494', '1.800', '0.1735', '1.801', '0.0870', '7.000', '0.7077', 1, 1, 1, 1, 1728333460.902643]
VI_at__the_End : ['1.202', '0.4714', '1.800', '0.1418', '1.800', '0.1195', '7.000', '0.7088', 1, 1, 1, 1, 1728333521.400839]