TEST_NAME : Wafer
TEST_DATE : 24_10_07-22_35_55
OPERATOR  : Carmen S.; Oleksandr S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-039-013-019-09 | FUSED_ID : 6359364768413831481
  IC_TEMP :  -59.77 | VDDM : 1119.64 | AUX_INT :   -8.78 | CsaBias :   78.86
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.41859e-03 / 2
  ADC_P0  : -8.77649e-03 ± 2.55242e-02
  ADC_P1  : 8.02858e-03 ± 5.94367e-04
  ADC_P2  : -5.61210e-06 ± 2.74234e-06
  CSA_Chi2/NDF : 5.72774e-05 / 2
  CSA_P0  : 5.89004e-02 ± 5.04794e-03
  CSA_P1  : 9.10158e-03 ± 3.80326e-04
  CSA_P2  : -3.72505e-05 ± 5.79191e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  2
 | N_BROKEN_FAST :  [64, 75]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  0
 | P_BROKEN_FAST :  []
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.202', '0.2621', '1.800', '0.1425', '1.800', '0.0925', '7.000', '0.7076', 1, 1, 1, 1, 1728333354.5202456]
VI_after__Init : ['1.202', '0.2622', '1.800', '0.1425', '1.801', '0.0870', '7.000', '0.7076', 1, 1, 1, 1, 1728333363.3444707]
VI_at__the_End : ['1.202', '0.4810', '1.800', '0.1378', '1.801', '0.1146', '7.000', '0.7084', 1, 1, 1, 1, 1728333432.7058449]