TEST_NAME : Wafer
TEST_DATE : 24_10_07-22_30_59
OPERATOR  : Carmen S.; Oleksandr S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-039-013-022-09 | FUSED_ID : 6359364768413831529
  IC_TEMP :  -62.68 | VDDM : 1116.75 | AUX_INT :  -27.92 | CsaBias :   68.31
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 2.07218e-03 / 2
  ADC_P0  : -2.79200e-02 ± 3.20194e-02
  ADC_P1  : 8.82952e-03 ± 7.86159e-04
  ADC_P2  : -7.40028e-06 ± 3.81405e-06
  CSA_Chi2/NDF : 1.39047e-04 / 2
  CSA_P0  : 5.85030e-02 ± 7.86509e-03
  CSA_P1  : 9.86950e-03 ± 5.92577e-04
  CSA_P2  : -4.88105e-05 ± 9.02425e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  1
 | N_BROKEN_FAST :  [36]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  3
 | P_BROKEN_FAST :  [15, 52, 75]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.202', '0.3491', '1.800', '0.1465', '1.799', '0.0968', '7.000', '0.7086', 1, 1, 1, 1, 1728333059.4975867]
VI_after__Init : ['1.202', '0.3494', '1.800', '0.1466', '1.800', '0.0896', '7.000', '0.7078', 1, 1, 1, 1, 1728333067.5279195]
VI_at__the_End : ['1.202', '0.4846', '1.800', '0.1395', '1.800', '0.1163', '7.000', '0.7086', 1, 1, 1, 1, 1728333135.850073]