TEST_NAME : Wafer
TEST_DATE : 24_10_07-22_27_42
OPERATOR  : Carmen S.; Oleksandr S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-039-013-024-09 | FUSED_ID : 6359364768413831561
  IC_TEMP :  -60.50 | VDDM : 1118.66 | AUX_INT :   -7.97 | CsaBias :   74.52
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.41039e-03 / 2
  ADC_P0  : -7.97008e-03 ± 2.54036e-02
  ADC_P1  : 8.31337e-03 ± 6.05259e-04
  ADC_P2  : -6.47775e-06 ± 2.84878e-06
  CSA_Chi2/NDF : 8.99787e-05 / 2
  CSA_P0  : 5.75416e-02 ± 6.32692e-03
  CSA_P1  : 9.28663e-03 ± 4.76688e-04
  CSA_P2  : -3.81414e-05 ± 7.25939e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  1
 | N_BROKEN_FAST :  [21]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  2
 | P_BROKEN_FAST :  [23, 60]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.202', '0.2568', '1.800', '0.1401', '1.800', '0.0861', '7.000', '0.7079', 1, 1, 1, 1, 1728332861.9323285]
VI_after__Init : ['1.202', '0.2568', '1.800', '0.1401', '1.802', '0.0806', '7.000', '0.7078', 1, 1, 1, 1, 1728332870.052643]
VI_at__the_End : ['1.198', '0.4850', '1.800', '0.1378', '1.805', '0.1156', '7.000', '0.7084', 1, 1, 1, 1, 1728332939.5166717]