TEST_NAME : Wafer
TEST_DATE : 24_10_07-22_24_23
OPERATOR  : Carmen S.; Oleksandr S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
------------------------------------------------------------
------------------------------------------------------------
ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-039-013-026-09 | FUSED_ID : 6359364768413831593
  IC_TEMP :  -57.16 | VDDM : 1131.84 | AUX_INT :  -59.40 | CsaBias :   45.00
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 9.90576e-04 / 2
  ADC_P0  : -5.93992e-02 ± 2.37391e-02
  ADC_P1  : 8.78464e-03 ± 5.60978e-04
  ADC_P2  : -7.09184e-06 ± 2.61786e-06
  CSA_Chi2/NDF : 1.22365e-04 / 2
  CSA_P0  : 5.73751e-02 ± 7.37822e-03
  CSA_P1  : 9.77428e-03 ± 5.55896e-04
  CSA_P2  : -4.12268e-05 ± 8.46563e-06
------------------------------------------------------------
ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  3
 | N_BROKEN_FAST :  [30, 40, 79]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  0
 | P_BROKEN_FAST :  []
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
------------------------------------------------------------
------------------------------------------------------------
VI_before_Init : ['1.202', '0.2700', '1.800', '0.1350', '1.799', '0.0922', '7.000', '0.7079', 1, 1, 1, 1, 1728332663.1043696]
VI_after__Init : ['1.202', '0.2701', '1.800', '0.1351', '1.799', '0.0869', '7.000', '0.7079', 1, 1, 1, 1, 1728332671.875695]
VI_at__the_End : ['1.202', '0.5039', '1.800', '0.1373', '1.802', '0.1141', '7.000', '0.7085', 1, 1, 1, 1, 1728332731.3769526]