TEST_NAME : Wafer
TEST_DATE : 24_10_07-23_03_49
OPERATOR  : Carmen S.; Oleksandr S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-039-014-003-00 | FUSED_ID : 6359364768413835312
  IC_TEMP :  -64.56 | VDDM : 1119.88 | AUX_INT :   -9.61 | CsaBias :   70.78
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.36131e-03 / 2
  ADC_P0  : -9.61039e-03 ± 2.49277e-02
  ADC_P1  : 9.00154e-03 ± 6.36594e-04
  ADC_P2  : -7.71339e-06 ± 3.22427e-06
  CSA_Chi2/NDF : 1.62311e-04 / 2
  CSA_P0  : 5.85084e-02 ± 8.49759e-03
  CSA_P1  : 1.00767e-02 ± 6.40232e-04
  CSA_P2  : -5.08843e-05 ± 9.74997e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  0
 | N_BROKEN_FAST :  []
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  1
 | P_BROKEN_FAST :  [75]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  A ASIC READY for MODULE ASSEMBLY
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VI_before_Init : ['1.202', '0.2426', '1.800', '0.1749', '1.800', '0.0868', '7.000', '0.7080', 1, 1, 1, 1, 1728335028.5572472]
VI_after__Init : ['1.202', '0.2427', '1.800', '0.1751', '1.799', '0.0817', '7.000', '0.7078', 1, 1, 1, 1, 1728335037.3716683]
VI_at__the_End : ['1.202', '0.4870', '1.800', '0.1391', '1.804', '0.1153', '7.000', '0.7086', 1, 1, 1, 1, 1728335097.5941927]