TEST_NAME : Wafer
TEST_DATE : 24_10_07-23_05_27
OPERATOR  : Carmen S.; Oleksandr S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-039-014-004-00 | FUSED_ID : 6359364768413835328
  IC_TEMP :  -60.16 | VDDM : 1122.98 | AUX_INT :   -5.22 | CsaBias :   79.72
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 8.41798e-04 / 2
  ADC_P0  : -5.22456e-03 ± 1.96364e-02
  ADC_P1  : 8.55449e-03 ± 4.98543e-04
  ADC_P2  : -5.98382e-06 ± 2.49475e-06
  CSA_Chi2/NDF : 1.46435e-04 / 2
  CSA_P0  : 5.78616e-02 ± 8.07132e-03
  CSA_P1  : 1.00568e-02 ± 6.08116e-04
  CSA_P2  : -4.93500e-05 ± 9.26088e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  2
 | N_BROKEN_FAST :  [28, 126]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  1
 | P_BROKEN_FAST :  [38]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.202', '0.3124', '1.800', '0.1504', '1.800', '0.0891', '7.000', '0.7079', 1, 1, 1, 1, 1728335127.4360914]
VI_after__Init : ['1.202', '0.3124', '1.800', '0.1504', '1.801', '0.0836', '7.000', '0.7080', 1, 1, 1, 1, 1728335135.5655084]
VI_at__the_End : ['1.202', '0.4945', '1.800', '0.1415', '1.799', '0.1139', '7.000', '0.7089', 1, 1, 1, 1, 1728335195.5920472]