TEST_NAME : Wafer
TEST_DATE : 24_10_07-23_07_06
OPERATOR  : Carmen S.; Oleksandr S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
------------------------------------------------------------
------------------------------------------------------------
ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-039-014-005-00 | FUSED_ID : 6359364768413835344
  IC_TEMP :  -61.29 | VDDM : 1122.85 | AUX_INT :   -7.25 | CsaBias :   77.39
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.00110e-03 / 2
  ADC_P0  : -7.25413e-03 ± 2.13638e-02
  ADC_P1  : 8.53125e-03 ± 5.24162e-04
  ADC_P2  : -6.64796e-06 ± 2.54804e-06
  CSA_Chi2/NDF : 1.30067e-04 / 2
  CSA_P0  : 5.61817e-02 ± 7.60688e-03
  CSA_P1  : 9.95060e-03 ± 5.73124e-04
  CSA_P2  : -4.79615e-05 ± 8.72799e-06
------------------------------------------------------------
ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  1
 | N_BROKEN_FAST :  [86]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  0
 | P_BROKEN_FAST :  []
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
------------------------------------------------------------
------------------------------------------------------------
VI_before_Init : ['1.202', '0.2764', '1.800', '0.1657', '1.800', '0.0928', '7.000', '0.7080', 1, 1, 1, 1, 1728335226.693677]
VI_after__Init : ['1.202', '0.2764', '1.800', '0.1657', '1.801', '0.0873', '7.000', '0.7081', 1, 1, 1, 1, 1728335234.802163]
VI_at__the_End : ['1.202', '0.4868', '1.800', '0.1408', '1.804', '0.1125', '7.000', '0.7088', 1, 1, 1, 1, 1728335299.788422]