TEST_NAME : Wafer
TEST_DATE : 24_10_07-23_12_02
OPERATOR  : Carmen S.; Oleksandr S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-039-014-008-00 | FUSED_ID : 6359364768413835392
  IC_TEMP :  -55.59 | VDDM : 1116.24 | AUX_INT :  -11.53 | CsaBias :   78.10
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 2.27711e-03 / 2
  ADC_P0  : -1.15341e-02 ± 3.24356e-02
  ADC_P1  : 8.20847e-03 ± 7.69946e-04
  ADC_P2  : -5.47310e-06 ± 3.65895e-06
  CSA_Chi2/NDF : 1.29290e-04 / 2
  CSA_P0  : 5.80551e-02 ± 7.58411e-03
  CSA_P1  : 9.69947e-03 ± 5.71408e-04
  CSA_P2  : -4.39681e-05 ± 8.70187e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  2
 | N_BROKEN_FAST :  [21, 95]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  2
 | P_BROKEN_FAST :  [52, 85]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.202', '0.3245', '1.800', '0.1669', '1.800', '0.0910', '7.000', '0.7079', 1, 1, 1, 1, 1728335522.3427732]
VI_after__Init : ['1.202', '0.3245', '1.800', '0.1669', '1.801', '0.0852', '7.000', '0.7079', 1, 1, 1, 1, 1728335530.5262516]
VI_at__the_End : ['1.202', '0.4914', '1.800', '0.1376', '1.807', '0.1135', '7.000', '0.7086', 1, 1, 1, 1, 1728335598.0621438]