TEST_NAME : Wafer
TEST_DATE : 24_10_07-23_13_41
OPERATOR  : Carmen S.; Oleksandr S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-039-014-009-00 | FUSED_ID : 6359364768413835408
  IC_TEMP :  -74.55 | VDDM : 1099.08 | AUX_INT :  -10.57 | CsaBias :   63.40
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.70033e-03 / 2
  ADC_P0  : -1.05737e-02 ± 2.79008e-02
  ADC_P1  : 8.27663e-03 ± 6.54412e-04
  ADC_P2  : -6.42270e-06 ± 3.05303e-06
  CSA_Chi2/NDF : 2.14889e-04 / 2
  CSA_P0  : 5.66275e-02 ± 9.77754e-03
  CSA_P1  : 1.03165e-02 ± 7.36667e-04
  CSA_P2  : -6.01837e-05 ± 1.12186e-05
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  1
 | N_BROKEN_FAST :  [41]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  2
 | P_BROKEN_FAST :  [1, 103]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.201', '0.4782', '1.800', '0.1234', '1.799', '0.1020', '6.999', '0.7079', 1, 1, 1, 1, 1728335621.0484445]
VI_after__Init : ['1.202', '0.4760', '1.800', '0.1241', '1.801', '0.0968', '7.000', '0.7083', 1, 1, 1, 1, 1728335630.009655]
VI_at__the_End : ['1.202', '0.4635', '1.800', '0.1387', '1.799', '0.1183', '7.000', '0.7087', 1, 1, 1, 1, 1728335694.2418451]