TEST_NAME : Wafer
TEST_DATE : 24_10_07-23_16_59
OPERATOR  : Carmen S.; Oleksandr S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-039-014-011-00 | FUSED_ID : 6359364768413835440
  IC_TEMP :  -63.50 | VDDM : 1122.98 | AUX_INT :   -9.19 | CsaBias :   65.42
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.57668e-03 / 2
  ADC_P0  : -9.19008e-03 ± 2.69077e-02
  ADC_P1  : 8.34510e-03 ± 6.48646e-04
  ADC_P2  : -6.17836e-06 ± 3.09756e-06
  CSA_Chi2/NDF : 1.16494e-04 / 2
  CSA_P0  : 5.93241e-02 ± 7.19904e-03
  CSA_P1  : 9.70388e-03 ± 5.42396e-04
  CSA_P2  : -4.69532e-05 ± 8.26005e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  2
 | N_BROKEN_FAST :  [56, 88]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  1
 | P_BROKEN_FAST :  [87]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.202', '0.1007', '1.800', '0.1517', '1.800', '0.0890', '7.000', '0.7079', 1, 1, 1, 1, 1728335819.3093858]
VI_after__Init : ['1.202', '0.1007', '1.800', '0.1517', '1.800', '0.0835', '6.999', '0.7081', 1, 1, 1, 1, 1728335827.5126753]
VI_at__the_End : ['1.202', '0.4780', '1.800', '0.1369', '1.808', '0.1160', '7.000', '0.7086', 1, 1, 1, 1, 1728335886.3413434]