TEST_NAME : Wafer
TEST_DATE : 24_10_07-23_20_17
OPERATOR  : Carmen S.; Oleksandr S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
------------------------------------------------------------
------------------------------------------------------------
ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-039-014-013-00 | FUSED_ID : 6359364768413835472
  IC_TEMP :  -66.58 | VDDM : 1122.73 | AUX_INT :   -7.02 | CsaBias :   70.37
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.05776e-03 / 2
  ADC_P0  : -7.01824e-03 ± 2.20290e-02
  ADC_P1  : 8.65510e-03 ± 5.61270e-04
  ADC_P2  : -6.28131e-06 ± 2.82210e-06
  CSA_Chi2/NDF : 1.72057e-04 / 2
  CSA_P0  : 5.91482e-02 ± 8.74900e-03
  CSA_P1  : 1.02249e-02 ± 6.59174e-04
  CSA_P2  : -5.41501e-05 ± 1.00384e-05
------------------------------------------------------------
ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  1
 | N_BROKEN_FAST :  [123]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  5
 | P_BROKEN_FAST :  [0, 11, 43, 92, 99]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
------------------------------------------------------------
------------------------------------------------------------
VI_before_Init : ['1.202', '0.2438', '1.800', '0.1711', '1.799', '0.0844', '7.000', '0.7082', 1, 1, 1, 1, 1728336017.7582216]
VI_after__Init : ['1.202', '0.2439', '1.800', '0.1711', '1.800', '0.0793', '7.000', '0.7082', 1, 1, 1, 1, 1728336025.8507059]
VI_at__the_End : ['1.202', '0.4849', '1.800', '0.1408', '1.800', '0.1190', '7.000', '0.7086', 1, 1, 1, 1, 1728336085.7991502]