TEST_NAME : Wafer
TEST_DATE : 24_10_07-23_21_55
OPERATOR  : Carmen S.; Oleksandr S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-039-014-014-00 | FUSED_ID : 6359364768413835488
  IC_TEMP :  -64.54 | VDDM : 1123.70 | AUX_INT :   -8.49 | CsaBias :   65.49
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.30387e-03 / 2
  ADC_P0  : -8.48703e-03 ± 2.44511e-02
  ADC_P1  : 8.27384e-03 ± 5.87417e-04
  ADC_P2  : -5.98666e-06 ± 2.79247e-06
  CSA_Chi2/NDF : 9.40152e-05 / 2
  CSA_P0  : 5.94892e-02 ± 6.46727e-03
  CSA_P1  : 9.66661e-03 ± 4.87262e-04
  CSA_P2  : -4.61057e-05 ± 7.42043e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  0
 | N_BROKEN_FAST :  []
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  2
 | P_BROKEN_FAST :  [3, 122]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.202', '0.1854', '1.800', '0.1431', '1.800', '0.0860', '7.000', '0.7081', 1, 1, 1, 1, 1728336115.1159022]
VI_after__Init : ['1.202', '0.1855', '1.800', '0.1432', '1.800', '0.0804', '7.000', '0.7080', 1, 1, 1, 1, 1728336123.8693383]
VI_at__the_End : ['1.202', '0.4815', '1.800', '0.1385', '1.804', '0.1170', '7.000', '0.7088', 1, 1, 1, 1, 1728336189.5781565]