TEST_NAME : Wafer
TEST_DATE : 24_10_07-23_23_34
OPERATOR  : Carmen S.; Oleksandr S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-039-014-015-00 | FUSED_ID : 6359364768413835504
  IC_TEMP :  -60.84 | VDDM : 1126.71 | AUX_INT :   -6.26 | CsaBias :   74.95
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.18464e-03 / 2
  ADC_P0  : -6.26227e-03 ± 2.33411e-02
  ADC_P1  : 8.17406e-03 ± 5.66674e-04
  ADC_P2  : -5.30575e-06 ± 2.71842e-06
  CSA_Chi2/NDF : 1.10642e-04 / 2
  CSA_P0  : 6.00481e-02 ± 7.01588e-03
  CSA_P1  : 9.68362e-03 ± 5.28596e-04
  CSA_P2  : -4.56820e-05 ± 8.04989e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  1
 | N_BROKEN_FAST :  [9]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  3
 | P_BROKEN_FAST :  [19, 20, 72]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.202', '0.2384', '1.800', '0.1553', '1.800', '0.0978', '7.000', '0.7080', 1, 1, 1, 1, 1728336213.8423922]
VI_after__Init : ['1.202', '0.2385', '1.800', '0.1552', '1.800', '0.0923', '6.999', '0.7081', 1, 1, 1, 1, 1728336222.005763]
VI_at__the_End : ['1.202', '0.4836', '1.800', '0.1388', '1.804', '0.1165', '7.000', '0.7086', 1, 1, 1, 1, 1728336292.0033684]