TEST_NAME : Wafer
TEST_DATE : 24_10_07-23_25_12
OPERATOR  : Carmen S.; Oleksandr S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
------------------------------------------------------------
------------------------------------------------------------
ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-039-014-016-07 | FUSED_ID : 6359364768413835527
  IC_TEMP :  -59.26 | VDDM : 1131.44 | AUX_INT :   -6.79 | CsaBias :   89.99
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.10837e-03 / 2
  ADC_P0  : -6.78576e-03 ± 2.25975e-02
  ADC_P1  : 8.11807e-03 ± 5.54062e-04
  ADC_P2  : -4.43567e-06 ± 2.70282e-06
  CSA_Chi2/NDF : 1.07725e-04 / 2
  CSA_P0  : 5.93528e-02 ± 6.92279e-03
  CSA_P1  : 9.81432e-03 ± 5.21582e-04
  CSA_P2  : -4.66888e-05 ± 7.94308e-06
------------------------------------------------------------
ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  1
 | N_BROKEN_FAST :  [13]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  2
 | P_BROKEN_FAST :  [4, 54]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
------------------------------------------------------------
------------------------------------------------------------
VI_before_Init : ['1.202', '0.4525', '1.800', '0.1366', '1.799', '0.1014', '7.000', '0.7090', 1, 1, 1, 1, 1728336311.5798545]
VI_after__Init : ['1.202', '0.4530', '1.800', '0.1371', '1.801', '0.0943', '7.000', '0.7081', 1, 1, 1, 1, 1728336320.3722608]
VI_at__the_End : ['1.202', '0.4878', '1.800', '0.1402', '1.800', '0.1147', '7.000', '0.7087', 1, 1, 1, 1, 1728336387.7699726]