TEST_NAME : Wafer
TEST_DATE : 24_10_07-23_28_29
OPERATOR  : Carmen S.; Oleksandr S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-039-014-018-07 | FUSED_ID : 6359364768413835559
  IC_TEMP :  -53.18 | VDDM : 1124.98 | AUX_INT :  -25.31 | CsaBias :   77.17
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.46772e-03 / 2
  ADC_P0  : -2.53147e-02 ± 2.68169e-02
  ADC_P1  : 7.95802e-03 ± 5.99653e-04
  ADC_P2  : -5.75647e-06 ± 2.65685e-06
  CSA_Chi2/NDF : 7.18930e-05 / 2
  CSA_P0  : 5.92618e-02 ± 5.65543e-03
  CSA_P1  : 9.58064e-03 ± 4.26096e-04
  CSA_P2  : -4.07827e-05 ± 6.48894e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  1
 | N_BROKEN_FAST :  [33]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  0
 | P_BROKEN_FAST :  []
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  A ASIC READY for MODULE ASSEMBLY
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VI_before_Init : ['1.202', '0.2140', '1.800', '0.1496', '1.800', '0.0812', '7.000', '0.7083', 1, 1, 1, 1, 1728336509.6227753]
VI_after__Init : ['1.202', '0.2140', '1.800', '0.1496', '1.800', '0.0761', '7.000', '0.7082', 1, 1, 1, 1, 1728336517.8000667]
VI_at__the_End : ['1.202', '0.4952', '1.800', '0.1377', '1.806', '0.1114', '7.000', '0.7088', 1, 1, 1, 1, 1728336577.9694202]