TEST_NAME : Wafer
TEST_DATE : 24_10_07-23_35_04
OPERATOR  : Carmen S.; Oleksandr S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-039-014-022-07 | FUSED_ID : 6359364768413835623
  IC_TEMP :  -56.06 | VDDM : 1122.62 | AUX_INT :   -8.78 | CsaBias :   87.29
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.69051e-03 / 2
  ADC_P0  : -8.77704e-03 ± 2.78913e-02
  ADC_P1  : 8.07215e-03 ± 6.53622e-04
  ADC_P2  : -5.51464e-06 ± 3.04527e-06
  CSA_Chi2/NDF : 1.01258e-04 / 2
  CSA_P0  : 5.83738e-02 ± 6.71178e-03
  CSA_P1  : 9.49173e-03 ± 5.05685e-04
  CSA_P2  : -4.01635e-05 ± 7.70098e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  2
 | N_BROKEN_FAST :  [7, 99]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  1
 | P_BROKEN_FAST :  [101]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.202', '0.1872', '1.800', '0.1387', '1.800', '0.0828', '7.000', '0.7077', 1, 1, 1, 1, 1728336903.6920826]
VI_after__Init : ['1.202', '0.1871', '1.800', '0.1387', '1.800', '0.0773', '7.000', '0.7076', 1, 1, 1, 1, 1728336912.4134595]
VI_at__the_End : ['1.202', '0.4917', '1.800', '0.1372', '1.802', '0.1117', '7.000', '0.7084', 1, 1, 1, 1, 1728336981.5495393]