TEST_NAME : Wafer
TEST_DATE : 24_10_07-23_36_42
OPERATOR  : Carmen S.; Oleksandr S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-039-014-023-07 | FUSED_ID : 6359364768413835639
  IC_TEMP :  -59.58 | VDDM : 1126.20 | AUX_INT :  -24.75 | CsaBias :   74.85
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.57998e-03 / 2
  ADC_P0  : -2.47537e-02 ± 2.78973e-02
  ADC_P1  : 8.37759e-03 ± 6.58988e-04
  ADC_P2  : -6.40803e-06 ± 3.07352e-06
  CSA_Chi2/NDF : 1.16408e-04 / 2
  CSA_P0  : 5.71133e-02 ± 7.19637e-03
  CSA_P1  : 9.69675e-03 ± 5.42195e-04
  CSA_P2  : -4.38965e-05 ± 8.25698e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  0
 | N_BROKEN_FAST :  []
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  2
 | P_BROKEN_FAST :  [25, 119]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.202', '0.3249', '1.799', '0.1688', '1.800', '0.0875', '7.000', '0.7072', 1, 1, 1, 1, 1728337001.5860085]
VI_after__Init : ['1.202', '0.3250', '1.800', '0.1689', '1.800', '0.0822', '6.999', '0.7076', 1, 1, 1, 1, 1728337010.3454342]
VI_at__the_End : ['1.202', '0.4901', '1.800', '0.1366', '1.800', '0.1139', '7.000', '0.7083', 1, 1, 1, 1, 1728337078.9743743]