TEST_NAME : Wafer
TEST_DATE : 24_10_07-23_38_20
OPERATOR  : Carmen S.; Oleksandr S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-039-014-024-07 | FUSED_ID : 6359364768413835655
  IC_TEMP :  -55.58 | VDDM : 1113.25 | AUX_INT :  -10.84 | CsaBias :   73.50
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 2.12131e-03 / 2
  ADC_P0  : -1.08403e-02 ± 3.12666e-02
  ADC_P1  : 8.49822e-03 ± 7.61341e-04
  ADC_P2  : -6.40258e-06 ± 3.68955e-06
  CSA_Chi2/NDF : 1.21304e-04 / 2
  CSA_P0  : 6.01659e-02 ± 7.34616e-03
  CSA_P1  : 9.85373e-03 ± 5.53480e-04
  CSA_P2  : -4.38862e-05 ± 8.42885e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  1
 | N_BROKEN_FAST :  [70]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  2
 | P_BROKEN_FAST :  [39, 116]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.202', '0.1608', '1.800', '0.1335', '1.800', '0.0808', '7.000', '0.7076', 1, 1, 1, 1, 1728337099.7809825]
VI_after__Init : ['1.202', '0.1609', '1.800', '0.1335', '1.800', '0.0754', '7.000', '0.7075', 1, 1, 1, 1, 1728337107.9823992]
VI_at__the_End : ['1.202', '0.5029', '1.800', '0.1375', '1.806', '0.1125', '7.000', '0.7079', 1, 1, 1, 1, 1728337172.5066135]