TEST_NAME : Wafer
TEST_DATE : 24_10_08-00_11_12
OPERATOR  : Carmen S.; Oleksandr S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-039-015-008-13 | FUSED_ID : 6359364768413839501
  IC_TEMP :  -60.25 | VDDM : 1106.06 | AUX_INT :   -9.93 | CsaBias :   79.71
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.72819e-03 / 2
  ADC_P0  : -9.93191e-03 ± 2.82190e-02
  ADC_P1  : 8.20892e-03 ± 6.76685e-04
  ADC_P2  : -5.41891e-06 ± 3.23248e-06
  CSA_Chi2/NDF : 1.40964e-04 / 2
  CSA_P0  : 5.98277e-02 ± 7.91910e-03
  CSA_P1  : 9.86827e-03 ± 5.96647e-04
  CSA_P2  : -4.68282e-05 ± 9.08623e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  1
 | N_BROKEN_FAST :  [32]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  0
 | P_BROKEN_FAST :  []
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.202', '0.3982', '1.800', '0.1514', '1.800', '0.0970', '7.000', '0.7076', 1, 1, 1, 1, 1728339071.8916566]
VI_after__Init : ['1.201', '0.3985', '1.800', '0.1516', '1.800', '0.0915', '7.000', '0.7076', 1, 1, 1, 1, 1728339079.9090059]
VI_at__the_End : ['1.202', '0.4917', '1.800', '0.1398', '1.800', '0.1138', '7.000', '0.7085', 1, 1, 1, 1, 1728339146.9504814]