TEST_NAME : Wafer
TEST_DATE : 24_10_08-00_07_55
OPERATOR  : Carmen S.; Oleksandr S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-039-015-010-13 | FUSED_ID : 6359364768413839533
  IC_TEMP :  -57.55 | VDDM : 1120.17 | AUX_INT :   -9.25 | CsaBias :   85.98
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.43243e-03 / 2
  ADC_P0  : -9.25429e-03 ± 2.56634e-02
  ADC_P1  : 7.99781e-03 ± 6.01273e-04
  ADC_P2  : -5.12098e-06 ± 2.80394e-06
  CSA_Chi2/NDF : 1.29098e-04 / 2
  CSA_P0  : 5.86420e-02 ± 7.57848e-03
  CSA_P1  : 9.80689e-03 ± 5.70984e-04
  CSA_P2  : -4.48969e-05 ± 8.69541e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  2
 | N_BROKEN_FAST :  [104, 118]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  2
 | P_BROKEN_FAST :  [16, 49]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.202', '0.3162', '1.800', '0.1488', '1.800', '0.0915', '7.000', '0.7077', 1, 1, 1, 1, 1728338875.1748812]
VI_after__Init : ['1.202', '0.3165', '1.800', '0.1488', '1.801', '0.0857', '7.000', '0.7076', 1, 1, 1, 1, 1728338883.1833413]
VI_at__the_End : ['1.202', '0.4943', '1.800', '0.1371', '1.804', '0.1134', '7.000', '0.7083', 1, 1, 1, 1, 1728338943.4852495]