TEST_NAME : Wafer
TEST_DATE : 24_10_08-00_04_37
OPERATOR  : Carmen S.; Oleksandr S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-039-015-012-13 | FUSED_ID : 6359364768413839565
  IC_TEMP :  -57.54 | VDDM : 1107.54 | AUX_INT :  -82.08 | CsaBias :   17.00
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.52133e-03 / 2
  ADC_P0  : -8.20767e-02 ± 3.03559e-02
  ADC_P1  : 9.10833e-03 ± 6.86946e-04
  ADC_P2  : -9.24770e-06 ± 3.05752e-06
  CSA_Chi2/NDF : 8.46799e-05 / 2
  CSA_P0  : 5.82366e-02 ± 6.13780e-03
  CSA_P1  : 9.23945e-03 ± 4.62439e-04
  CSA_P2  : -3.82968e-05 ± 7.04240e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  1
 | N_BROKEN_FAST :  [114]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  1
 | P_BROKEN_FAST :  [123]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.201', '0.3346', '1.800', '0.1648', '1.800', '0.0966', '7.000', '0.7083', 1, 1, 1, 1, 1728338677.769015]
VI_after__Init : ['1.202', '0.3347', '1.800', '0.1648', '1.799', '0.0887', '7.000', '0.7076', 1, 1, 1, 1, 1728338685.79348]
VI_at__the_End : ['1.202', '0.4851', '1.800', '0.1378', '1.800', '0.1146', '7.000', '0.7081', 1, 1, 1, 1, 1728338753.7623427]