TEST_NAME : Wafer
TEST_DATE : 24_10_08-00_02_59
OPERATOR  : Carmen S.; Oleksandr S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-039-015-013-13 | FUSED_ID : 6359364768413839581
  IC_TEMP :  -59.44 | VDDM : 1115.22 | AUX_INT :   -9.93 | CsaBias :   81.08
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.45654e-03 / 2
  ADC_P0  : -9.93379e-03 ± 2.58203e-02
  ADC_P1  : 8.34181e-03 ± 6.17601e-04
  ADC_P2  : -6.18098e-06 ± 2.94094e-06
  CSA_Chi2/NDF : 1.20205e-04 / 2
  CSA_P0  : 6.07164e-02 ± 7.31280e-03
  CSA_P1  : 9.72690e-03 ± 5.50967e-04
  CSA_P2  : -4.53143e-05 ± 8.39058e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  2
 | N_BROKEN_FAST :  [60, 89]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  0
 | P_BROKEN_FAST :  []
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.202', '0.4125', '1.800', '0.1728', '1.800', '0.0954', '7.001', '0.7074', 1, 1, 1, 1, 1728338578.9225378]
VI_after__Init : ['1.201', '0.4130', '1.800', '0.1729', '1.799', '0.0897', '6.999', '0.7076', 1, 1, 1, 1, 1728338586.9698396]
VI_at__the_End : ['1.202', '0.4904', '1.800', '0.1381', '1.800', '0.1133', '7.000', '0.7083', 1, 1, 1, 1, 1728338649.1481645]