TEST_NAME : Wafer
TEST_DATE : 24_10_08-00_01_20
OPERATOR  : Carmen S.; Oleksandr S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-039-015-014-13 | FUSED_ID : 6359364768413839597
  IC_TEMP :  -64.16 | VDDM : 1111.62 | AUX_INT : -105.12 | CsaBias :    0.73
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.65693e-03 / 2
  ADC_P0  : -1.05119e-01 ± 3.32168e-02
  ADC_P1  : 9.74209e-03 ± 7.75910e-04
  ADC_P2  : -1.08701e-05 ± 3.55324e-06
  CSA_Chi2/NDF : 1.11186e-04 / 2
  CSA_P0  : 5.92118e-02 ± 7.03312e-03
  CSA_P1  : 9.50680e-03 ± 5.29895e-04
  CSA_P2  : -4.50073e-05 ± 8.06967e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  1
 | N_BROKEN_FAST :  [126]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  0
 | P_BROKEN_FAST :  []
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.201', '0.3050', '1.800', '0.1382', '1.799', '0.0894', '7.000', '0.7076', 1, 1, 1, 1, 1728338480.4839659]
VI_after__Init : ['1.202', '0.3051', '1.800', '0.1382', '1.800', '0.0844', '7.000', '0.7073', 1, 1, 1, 1, 1728338488.4733763]
VI_at__the_End : ['1.202', '0.4760', '1.800', '0.1387', '1.799', '0.1159', '7.000', '0.7080', 1, 1, 1, 1, 1728338550.1976132]